Manufacturer: ANTLIA
Product number: AHBO31

EUR 226,00


incl. 19 % VAT (DE)  
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Antlia H beta and O III Filter for visual Observation and Photography, 1.25"
The Antlia HB-OIII filter is engineered specifically for night visual nebulae observation at a high contrast and Deep-sky astrophotography. Its transmission is 90% or greater at critical wavelengths (H-Beta 486.1 nm, OIII 500.7 nm and OIII 495.9 nm). You’ll notice much higher contrast to observe Planetary Nebula, Supernova Remnant, Emission Nebula, Diffuse Nebula, and extremely faint nebulae by the Antlia HB-OIII filter.

When it is used for astro deep-sky imaging, it enhances the details of the [O III] and H-beta emission lines with astronomical cameras, DSLRs and DSLMs/MILCs.

Main Application and Performance:

Antlia HB-OIII filter was coated for almost total suppression of unwanted wavelengths with optical density (OD) 4 and the filter cut-off wavelength is 300-1000 nm, which meets the spectral requirements of photographic cameras and further enhances the suppression of the IR region. Compared with visual filters with a cut-off depth of OD3@350-750 nm, it performs better to darken the sky background and make deep-sky observation and photography of nebulae, star clusters, and galaxies more easily.

The HB-OIII filter helps faint objects become much more visible against the now darker background and produces near-photographic views of the Veil, Dumbbell, and Orion nebula, among many other objects under both light-polluted and dark skies.

Since human eyes are less sensitive at night, large aperture telescopes are recommended to gather light and funnel it into the observer´s eyes.

The quality features of this Antlia filter at a glance:
High light transmission for brighter image
Single substrate to eliminate internal reflections
Usable in light-polluted areas and dark locations

Substrate:Optical glass, single (non-glued)
Filter thickness:2 mm +/-0.05 mm
Cell:Low-profile metal cell, black anodized
CWL:486.1 nm (>90%), 495.9 nm (>90%), 500.7 nm (>90%)
Blocking:OD4@ 300-1000 nm
Surface quality:S/D (scratch/dig)= 60/40 (Refer to MIL-O-13830)
Surface accuracy:Lambda/4 or better
Parallelism:better than 30 arcsec
Filter
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